This focused workshop, in collaboration with Bruker, provides a hands-on introduction to one of the latest characterisation capabilities for 2D and other advanced materials: Nano Infrared Spectroscopy.
The Bruker NanoIR3 systems couple Atomic Force Microscopy with Infrared Spectroscopy capability, enabling nanoscale resolutions together with topological, thermal and electrical analysis.
The lab-based workshop, led by Dr Aravind Vijayaraghavan, will provide an introduction to the two NanoIR3 systems based at the National Graphene Instiute. Attendees will have the chance to explore its capability in the context of their own research and development interests, in collaboration with academics from the University of Manchester.
Read more about the Bruker NanoIR systems >
Bruker NanoIR3-s with Broadband Laser
The NanoIR3-s system enables the detection of infra-red interactions with a sample at nanoscale resolutions together with topological, thermal and electrical analysis.
The main operation modes of the Bruker NanoIR3s system enable the detection of light/matter interaction at nanoscale resolutions, giving both physical and chemical information by detecting dipolar oscillations. By coupling an atomic force microscope (AFM) with the spectroscopic and optical information gained using infra-red radiation, this is achieved through either detection of thermal expansion in the sample (PTIR) or by analysing the scattered light coming away from it (s-SNOM).
Alongside these complimentary techniques, the NanoIR3-s AFM microscope can also measure electrical, thermal and mechanical properties using specialised AFM modes (C-AFM, KPFM, NanoTA, SThM).
Bruker NanoIR3-Fluid system with QCL Laser
The Bruker NanoIR3-FLUID system is an AFM (atomic force microscope) instrument coupled with an infra-red laser light source which detects thermally expanding materials with nanoscale resolution.
This system has the ability to work both under dry or wet conditions making possible to perform experiments in-situ. The imaging of both sample types requires the incident laser source on this system to illuminate the sample from below. The strong absorption of water often reduces the effectiveness of IR spectroscopy on hydrated samples. To get around this, the incoming IR undergoes total internal reflection in an IR transparent crystal on which the sample sits. The evanescent wave that this produces is strongly localised on the crystal face and the sample in contact, and therefore IR transmission and absorption through the liquid is limited. As the AFM probe is in contact with the top surface of the sample during acquisition, there is a requirement that the sample thickness is low enough for an expansion to be detected.