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The nanoindenter records load and displacement changes in µN and sub-nanometre scales during indentation of a µm sized tip into a sample surface.
- Partner:UK Atomic Energy Authority
- Facility:Materials Research Facility (MRF)
- Availability:Available
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Detailed Description
Various methods, such as Continuous Measurement Stiffness, as well as different shapes and sizes of the indenter tips, can provide information on the mechanical properties of the material of interest.
Uses/Applications
The small volume required for the tests, as well as the automation of the device, makes it a great tool for gathering statistical data on mechanical properties of the surface of the materials. Hardness, elastic modulus, yield stress and true stress vs true strain behaviour can be obtained for bulk materials, and even for thin films.
Stage
Usable surface area 100mm x 100mm
Automated position control remote with mouse
Positioning accuracy 1µm
NanoVision Stage
Used for contact atomic force microscopy
X-Y scan range 100µm x 100µm
Positioning accuracy 1nm
XP Indentation Head
Displacement measurement via capacitance gauge
Displacement resolution <0.01nm
Loading capability: 500mN or 10N in high load
Contact force <1.0µN
Load frame stiffness ~5MN/m