Transmission Electron Microscope (TEM)

JEOL JEM-2100

David Cockayne Centre for Electron Microscopy | University of Oxford

The microscope operates a LaB6 source and is equipped with an Oxford instrument 80mm thin window EDS detector and a Gatan Orius CCD camera.

Description

The JEM-2100 is optimised for diffraction studies and diffraction-contrast imaging. In addition it performs well as a workhorse analytical TEM, supporting the high-end TEM systems in Oxford.