PerkinElmer NexION 2000 with Laser Ablation

ICP Suite (Inductively Coupled Plasma Mass Spectrometry)

Analytical technique primarily used for elemental determination

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Detailed Description

For nearly 30 years, ICP-MS has been gaining favour with laboratories for performing trace metal and elemental analysis with detection limits at or below the part per billion (ppb) level. An analytical working range of >10 orders of magnitude is available which is unsurpassed by any other technique.

ICP-MS is an analytical technique primarily used for elemental determination.

The sample is introduced into the ICP plasma via nebuliser. Samples are typically solutions using an autosampler for solid samples using a laser ablation technique.

A high temperature inductively coupled plasma source converts atoms in a sample to ions and these are directed into a mass spectrometer.

A quadrupole mass spectrometer separates the ion by their mass to charge ratio (m/z).


Semi-quantitative analysis: Provides a fingerprint of the elements present in a sample and the approximate concentrations.

Quantitative analysis: Accurately determines how much of a specific element is in the material analysed.

Isotopic analysis: Specific isotopes of an element can be measured and their ratio determined.

  • The NexION 2000 has the fastest data acquisition speed (100,000 points per second) available and is best equipped for nanoparticle determinations.
  • A mass range of 1-285amu is available with the quadrupole MS.
  • The NexION 2000 can be run in either standard, collision or reaction mode depending on interences.
  • This system is the only ICP-MS available that can run pure ammonia for complete and targeted interference removal.