Atomic Force Microscope

The Dimension XR NanoEC SPM utilises Bruker’s PeakForce Tapping technology and features the AFM-based PeakForce Scanning Electrochemical Microscopy (PF-SECM).

PF-SECM performs the simultaneous nanoscale mapping of electrochemical, electrical and mechanical properties in solution. High resolution topographical images can also be simultaneously acquired.

The electrochemical cell is compatible with a wide range of solutions and liquids including many solvents. The Dimension XR NanoEC has Bruker’s DataCube-SECM analysis software which generates 3D data maps where a specific electrical parameter is plotted in XY as a function of one other operating condition.

The Dimension XR NanoEC has additional specialised imaging modes which widen its range of application. The PeakForce TUNA module allows high sensitivity, high resolution current mapping to be performed on fragile samples such as organic photovoltaics, conductive nanotubes and nanoparticles.

The module has precise force control and eliminates lateral forces preventing sample damage. The current range covered is from pA up to nA. The PeakForce Kelvin Probe Force Microscopy (PF-KPFM) module performs nanoscale surface potential mapping with both frequency modulation and amplitude modulation.

The Scanning Capacitance Microscopy module maps the change in electrostatic capacitance between the scanned probe and the surface of a sample. This imaging mode can be used to map the relative changes in carrier concentrations in semiconductors.

The accompanying Dark-Lift software enhances the mapping accuracy and eliminates photelectric artifacts. The Dimension XR NanoEC has an additional FastScan option which is capable of producing high quality images at scan rates of 20Hz compared to standard imaging rates of 1Hz.

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