Electrical Image

User survey for Fast Scanning Transmission Electron Microscope (faSTEM) for soft matter analysis

The University of Leeds is applying for funding through the EPSRC Strategic Equipment Panel for a Transmission Electron Microscope optimised for chemically specific, atomic-scale imaging of non-conducting, organic compounds and soft matter. We’d like to get the views of potential external users of this equipment to make sure that this is a valuable addition to the UK materials community.

The short survey is available here

Achieving sub-nanometre analysis of soft matter requires a singular combination of fast (sub micrometre) scanning (S)TEM with spherical aberration correction and matched fast detectors with seamless software and hardware integration across 80-300 kV. The STEM will offer continuous control of electron flux with minimal optical changes (e.g. a monochromator). The STEM will supersede current detector read-out limitations that inhibit low dose imaging by incorporating a next generation pixelated, direct electron detector (DED; micrometres vs ms read-out) for nanodiffraction, differential phase contrast, and ptychographic imaging (i.e. 4D-STEM). For in tandem, spatially resolved composition and local bonding the STEM will include large solid angle energy dispersive X-ray (EDX) spectrometers and an electron energy loss spectrometer (EELS) with a DED (unique to the UK). For fast-scanning in specimen environments emulating operando conditions analytical cryo-transfer, heating, electrochemical and gas holders are included.

Equipment specification information is included within the survey. We intend to include a small external access fund in the proposal for pump-priming studies using the equipment.

Any queries regarding the survey please contact Prof Rik Drummond-Brydson (R.M.Drummond-Brydson@leeds.ac.uk)