Electrical Image

Virtual | 3-4 November 2020

Virtual RMS AFM & SPM Meeting

Date :
03 November 2020 - 04 November 2020
Time :
All Day

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RMS AFM & SPM 2020 represents an exciting opportunity to explore the latest developments in atomic force microscopies and scanning probe microscopies.

The AFM & SPM Meeting is held annually and provides an excellent forum for the community to meet and discuss the latest advances in the field. Supported by the manufacturers and including opportunities for attendees to present, it is a great event for atomic force microscopy users, scanning probe microscopy users, for PhD students and seasoned microscopists alike!

 

There is an exciting list of invited speakers lined up for this event:

  • KEYNOTE SPEAKER: Professor Takeshi Fukuma, Kanazawa University
  • Dr Nina Balke, Oak Ridge National Laboratory
  • Dr Simon Connell, University of Leeds
  • Professor Alex Dazzi, Universite Paris-Sud
  • Dr Lorena Redondo-Morata, Inserm
  • Dr Kristina Rusimova, University of Bath
  • Dr Steven Schofield, University College London
  • Professor Gijs Wuite, Vrije Universiteit Amsterdam

Scientific Organisers: Jamie Hobbs & Alice Pyne

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