University of Oxford

Oxford | 26th February 2020

TEM Sample Preparation Workshop

Date :
26 February 2020
Time :
9:45 am - 4:30 pm
Location :
Department of Materials, University of Oxford
Event Type :

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TEM Sample Preparation for Materials Science

TEM sample preparation using a FIBSEM can be a challenging task for a non-experienced user.

For this reason, we have partnered with ZEISS, the internationally leading technology enterprise in the fields of optics and optoelectronics, for a one day workshop where we will utilise the expertise of the David Cockayne Centre to achieve quality lamellae for material science based applications.

The ZEISS Crossbeam series offers a complete solution for preparing TEM lamellae, even for batches. During the workshop we will demonstrate workflows from initial setup and bulk milling through to lamellae liftout and final thinning of lamellae.

Places are free but limited so early booking is advised in order to avoid disappointment.

Participants will have the opportunity to operate three pieces of equipment:

    • ZEISS Crossbeam 540 FIB-SEM
    • ZEISS Auriga FIB-SEM
    • ZEISS NVision FIB-SEM



09:45-10:00 – Welcome and Introductions

10:00-10:50 – Presentation 1 – TEM sample preparation in the FIB-SEM by Dr Gareth Hughes

10:50-11:15 – Coffee Break

11:15-12:15 – Hands-on Session 1 – Initial setup and bulk milling

12:15-13:00 – Lunch break and networking

13:00-14:00 – Hands-on Session 2 – TEM lamella liftout

14:00-14:20 – Coffee break

14:20-15:45 – Hands-on Session 3 – Final thinning of TEM specimen

15:45-16:15 – Presentation 2 – Advances in ZEISS Crossbeam enabling easier sample preparation in materials science

16:15-16:30 – Q&A and summary