TEM Sample Preparation for Materials Science
TEM sample preparation using a FIBSEM can be a challenging task for a non-experienced user.
For this reason, we have partnered with ZEISS, the internationally leading technology enterprise in the fields of optics and optoelectronics, for a one day workshop where we will utilise the expertise of the David Cockayne Centre to achieve quality lamellae for material science based applications.
The ZEISS Crossbeam series offers a complete solution for preparing TEM lamellae, even for batches. During the workshop we will demonstrate workflows from initial setup and bulk milling through to lamellae liftout and final thinning of lamellae.
Places are free but limited so early booking is advised in order to avoid disappointment.
Participants will have the opportunity to operate three pieces of equipment:
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- ZEISS Crossbeam 540 FIB-SEM
- ZEISS Auriga FIB-SEM
- ZEISS NVision FIB-SEM
Agenda
09:45-10:00 – Welcome and Introductions
10:00-10:50 – Presentation 1 – TEM sample preparation in the FIB-SEM by Dr Gareth Hughes
10:50-11:15 – Coffee Break
11:15-12:15 – Hands-on Session 1 – Initial setup and bulk milling
12:15-13:00 – Lunch break and networking
13:00-14:00 – Hands-on Session 2 – TEM lamella liftout
14:00-14:20 – Coffee break
14:20-15:45 – Hands-on Session 3 – Final thinning of TEM specimen
15:45-16:15 – Presentation 2 – Advances in ZEISS Crossbeam enabling easier sample preparation in materials science
16:15-16:30 – Q&A and summary
