Correlative microscopy has the potential to transform the way in which battery research is conducted. Using correlative techniques, we can observe battery processes across a range of length-scales in an interconnected and targeted manner.
In these talks, we discuss a range of ion/laser milling techniques which assist correlative investigations by bridging the micro- and nano-scale information typically provided by tomography and TEM.
The talks aim to provide a more in-depth account of the techniques introduced in the 10th March Faraday Masterclass lecture given by Prof. Philip Withers and Dr. Matthew Curd. Although designed as a series, delegates are welcome to attend any/all of the talks which interest them.
In this talk (#1 of 3) we will discuss “dual beam” focussed ion beam (FIB) and scanning electron microscope (SEMs) instruments. FIB-SEMs are high precision cutting tools which can be used for cross-sectional imaging, 3D serial sectioning tomography and the fabrication of micro/nanoscale samples for TEM (and others). We will discuss these operations, material/geometric sample requirements and damage quantification with a focus on battery materials. We will discuss both traditional Ga source FIBs and high current Xe plasma FIBs, which can perform high speed, low damage milling on a range of materials.
In talk 2 we will cover Broad Ion Beam (BIB) and fs-laser techniques (booking link here);
In talk 3 we will discuss the post-acquisition processing and reconstruction of 3D-SST data (booking link here).