This workshop is intended to bring together researchers in the field of artificial intelligence based techniques applied to SEM, STEM and XRM imaging. The goal of the meeting is to describe the current landscape and present recent results for a range of applications in materials science showing different applications of AI methods. A round table discussion will conclude the half day meeting where the panelists will discuss future opportunities and the need for a general understanding of the applicability of the technique.
This workshop is free and open to anyone interested in the field of AI based microscopy imaging research. The topics discussed will be of an advanced level and therefore it is recommended that attendees are working in the field of microscopy. Undergraduate students are very welcome to join the event.
