Description
XRF is an ideal method of determining the chemical composition in a variety of materials. For low volume or difficult samples our XRF system has a Claisse LeNeo fusion instrument to prepare samples in glass disks for XRF analysis. Measurements are carried out directly on the material (solid or liquid), with minimal sample preparation required. There is no need for dilution or sample digestion prior to analysis. The Epsilon 4 XRF can handle a wide variety of sample types, such as:
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Solids
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Pressed powders
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Loose powders
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Liquids
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Fused beads
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Slurries
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Granules
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Filters
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Films and coatings
Specification
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10 position autosampler for high-throughput screening of samples
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Can detect elements from Na – Am