X-ray Fluorescence (XRF) System

Malvern Panalytical Epsilon 4

Materials Innovation Factory (MIF) | University of Liverpool

X-ray Fluorescence (XRF) spectrometry is a non-destructive method of analysing elemental composition of samples in the low ppm to weight percent range, specifically for inorganic components.

Description

XRF is an ideal method of determining the chemical composition in a variety of materials. For low volume or difficult samples our XRF system has a Claisse LeNeo fusion instrument to prepare samples in glass disks for XRF analysis. Measurements are carried out directly on the material (solid or liquid), with minimal sample preparation required. There is no need for dilution or sample digestion prior to analysis. The Epsilon 4 XRF can handle a wide variety of sample types, such as:

  • Solids

  • Pressed powders

  • Loose powders

  • Liquids

  • Fused beads

  • Slurries

  • Granules

  • Filters

  • Films and coatings

 

Specification

  • 10 position autosampler for high-throughput screening of samples

  • Can detect elements from Na – Am

Privacy Overview

This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.