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X-ray Fluorescence (XRF) System

Malvern Panalytical Epsilon 4

X-ray Fluorescence (XRF) spectrometry is a non-destructive method of analysing elemental composition of samples in the low ppm to weight percent range, specifically for inorganic components. For low volume or difficult samples our XRF system has a Claisse LeNeo fusion instrument to prepare samples in glass disks for XRF analysis.

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X-ray Fluorescence (XRF) System

Malvern Panalytical Epsilon 4

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