X-Ray Diffractometer

PANalytical - Aeris

The PANalytical Aeris X-ray Diffractometer is designed to be fast, efficient, and simple to use.

Description

The PANalytical Aeris is designed for routine sample analysis, especially fast quality control. It is suitable for loose powders, small volumes and small irregular shaped solids.

Uses / Applications

The PANalytical Aeris is commonly used to characterise powder and small solids for research, producing Rietveld quality patterns in minutes.

Specification

  • 6 position sample changer
  • Cu X-ray source
  • Ni Kβ incident beam filter
  • PIXcel1D detector
  • <0.04° 2θ resolution
  • ± 0.02° 2θ linearity
  • Excellent low angle resolution
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