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The F20–UV is a thin film analyser with the ability to measure thickness and refractive index in less than a second. Like all thickness measurement instruments, it connects to the USB port of the computer and is set-up in minutes.
- Partner:Imperial College London
- Facility:Thin Film Technology Laboratory
- Availability:Available
Or call us now on 0161 275 8382
Detailed Description
The thickness measurement ranges between 1nm – 40μm, with a wavelength range between 190 – 1100nm. Features included in the F20–UV include an integrated spectrometer, a flattening filter for highly reflective substrates, a FIL measure standalone software for remote data analysis, reflectance standards, thickness standard, SS-3 sample stage with fibre optic cable and a TH1-lamp.
The F20–UV is a thin film analyser with the ability to measure thickness and refractive index in less than a second. Like all thickness measurement instruments, it connects to the USB port of the computer and is set-up in minutes.