TEM Specimen Preparation

Fischione Model 1040 Nanomill TEM specimen preparation system plus accessories

Equipped with an ultra-low energy source.

Description

The Fischione Model 1040 NanoMill TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis, for either post-FIB (focused ion beam) processing or the enhancement of conventionally prepared specimens.

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