Description
The Fischione Model 1040 NanoMill TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis, for either post-FIB (focused ion beam) processing or the enhancement of conventionally prepared specimens.
A concentrated ion beam allows for the removal of amorphous and implanted material, improving sample quality and preparation artefacts. This is ideal for both FIB prepared, and conventionally polished samples.
A liquid nitrogen cooling stage provides low temperature milling reducing phase changes in suceptable material.
The NanoMill has an anerobic loading system to ensure air-sensitive materials can be studied.
