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Fischione Model 1040 Nanomill TEM specimen preparation system plus accessories
TEM Specimen Preparation
Equipped with an ultra-low energy source.
- Partner:University of Oxford
- Facility:David Cockayne Centre for Electron Microscopy
Or call us now on 0161 275 8382
Detailed Description
The Fischione Model 1040 NanoMill TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis, for either post-FIB (focused ion beam) processing or the enhancement of conventionally prepared specimens.