Description
These equipment are part of the Electron Microscopy Centre of the Multidisciplinary Characterisation Facility.
We have two Talos systems available. The Talos F200X is a latest generation Field Emission Gun Transmission Electron Microscope. It is equipped with a high brightness electron source and highly efficient EDS detectors, which make it ideally suited for fast elemental mapping at the sub-nanometer scale.
It is also fitted with a large field of view 4k CMOS camera for fast acquisition of (HR)TEM images and electron diffraction patterns. This microscope can be operated with a range of in-situ holders, including liquid heating/electrochemistry and heating/electrical holders.
The Talos 2 F200 is the same (S)TEM model as Talos 1 with additional capabilities. Fitted with a Scanning Precession Diffraction (SPED) system (NanoMegas Topsin) and hybrid pixel direct electron detector (Quantum Detectors MerlinEM), Talos 2 is capable of various scanning diffraction techniques (4D-STEM, SPED, MicroED, Ptychography). With segmented STEM detectors (Panther STEM), Talos 2 is also capable of differential phase contrast (DPC) imaging.
The combination of the excellent STEM-EDS performance of the Talos with SPED and other diffraction techniques give Talos 2 the unique characterisation capability for both structural and compositional analysis.
TALOS F200X
Brightness (@200kV) = 1.8×109 A/cm2/srad
Probe Current (@200kV) = 1.5nA @ 1nm probe
Super-X EDS detector (4x windowless SDD):
EDS solid angle = 0.9 srad
Energy resolution ≤ 136 eV (Mn Kα, 10 kcps)
X-TWIN pole piece:
STEM HAADF resolution = 0.16 nm
TEM Information limit = 0.12 nm
CETA 16M camera:
Sensor = 4096 x 4096 pixel CMOS
Frame rate 4k = 1 fps, 2k = 8 fps, 1k = 18 fps, 512 = 25 fps
TALOS 2
Electron Source: X-FEG
Accelerating Voltage: 80/200 kV
EDS: FEI Super-X
TEM Camera: FEI CETA 4K (High speed)
Diffraction Camera: Quantum Detectors MerlinEM (Quad)
SPED: NanoMegas Topsin
