Scanning Transmission Electron Microscope

JEOL ARM 200F Scanning Transmission Electron Microscope

Equipped with a Cs-corrector for the electron probe enabling atomic resolution imaging in a wide range of materials. The system includes STEM-bright field and STEM-HAADF detectors.

Description

With a cold-field emission gun and Gatan Quantum EEL spectrometer quantitative EELS and spectrum imaging is possible down to the atomic scale. EDX mapping using the JEOL Centurio high solid-angle EDX spectrometer may be combined with simultaneous HAADF imaging and EELS. In addition, it is capable of annular bright-field imaging and also has a direct electron detector optimised for ptychography; both of which are ideal imaging modes for analysis of light elements such as lithium in energy storage material applications. A vacuum transfer holder is available for handling air sensitive materials.

Privacy Overview

This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.