The Henry Royce Institute
The Henry Royce Institute

Scanning Electron Microscope with Cryo-Stage and Focused Ion Beam (Cryo-SEM/FIB)

TESCAN S8000G SEM/FIB with Oxford Instruments EDS/WDS and Quorum PP3010 cryo preparation system

Scanning Electron Microscopy (SEM) Laboratory | University of Liverpool

This setup is ideal for research requiring high-resolution imaging and compositional mapping of samples in their frozen-hydrated state, preventing artifacts associated with conventional sample preparation methods.

Home / Equipment & Facilities / Scanning Electron Microscope with Cryo-Stage and Focused Ion Beam (Cryo-SEM/FIB)

Description

The Tescan S8000G FIB/SEM has a thermal Field Emission Gun (FEG) capable of producing 400 nA of beam current. Images are obtained using in-chamber and in-column secondary electron (SE) and back-scattered electron (BSE) detectors. The instrument has a gallium ion column capable of producing 100 nA beam current. The analysis suite is provided by Oxford Instruments, and is comprised of EDS and WDS systems.

Cryo-FIB/SEM: 3D imaging and analysis of vitrified biological, food, or cosmetic samples.
Cryo-TEM Sample Prep: Site-specific fabrication of thin, cryo-lamellae for Cryo-Electron Tomography (Cryo-ET).
Materials Science: Characterization of beam-sensitive, soft materials, and composite materials, utilizing,in-situ,cryo-fracturing,and,analysis

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