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Scanning Electron Microscope with Cryo-Stage and Focused Ion Beam (Cryo-SEM/FIB)

TESCAN S8000G SEM/FIB with Oxford Instruments EDS/WDS and Quorum PP3010 cryo preparation system

The Tescan S8000G FIB/SEM has a thermal Field Emission Gun (FEG) capable of producing 400 nA of beam current. Images are obtained using in-chamber and in-column secondary electron (SE) and back-scattered electron (BSE) detectors. The instrument has a gallium ion column capable of producing 100 nA beam current. The analysis suite is provided by Oxford Instruments, and is comprised of EDS and WDS systems.

Home / Equipment & Facilities / Scanning Electron Microscope with Cryo-Stage and Focused Ion Beam (Cryo-SEM/FIB)

Scanning Electron Microscope with Cryo-Stage and Focused Ion Beam (Cryo-SEM/FIB)

TESCAN S8000G SEM/FIB with Oxford Instruments EDS/WDS and Quorum PP3010 cryo preparation system

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