Zeiss Crossbeam 540 FIB/SEM

Scanning Electron Microscope (FIB-SEM)

A FIB-SEM system featuring the Zeiss Capella FIB column and Gemini II SEM column.

Enquire Now

Or call us now on 0161 275 8382

Detailed Description

Optimised for nanofabrication, three-dimensional data-sets containing imaging, chemical and crystallographic information can be created from serial cross sectional imaging on this instrument, using the advanced Zeiss Atlas 5 imaging and patterning engine. An Oxford Instruments XMaxN 150 EDX detector and Nordlys Max EBSD system is fitted for analytical work.