This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
A FIB-SEM system featuring the Zeiss Capella FIB column and Gemini II SEM column.
- Partner:University of Oxford
- Facility:David Cockayne Centre for Electron Microscopy
Or call us now on 0161 275 8382
Detailed Description
Optimised for nanofabrication, three-dimensional data-sets containing imaging, chemical and crystallographic information can be created from serial cross sectional imaging on this instrument, using the advanced Zeiss Atlas 5 imaging and patterning engine. An Oxford Instruments XMaxN 150 EDX detector and Nordlys Max EBSD system is fitted for analytical work.