Sample Preparation for Non-radioactive Materials

UKAEA Materials Research Facility has a fully equipped sample preparation laboratory that houses a series of modern equipment to prepare metal specimens for optical and electron beam microscopy.

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Detailed Description

UKAEA-MRF has a fully equipped sample preparation laboratory that houses a series of modern equipment to prepare metal specimens for optical and electron beam microscopy. The finest possible finish allows, for example, Electron Backscattered Diffraction (EBSD) analysis or strain analysis on fatigue samples.

Uses/Applications

Preparation of samples for analysis in SEM, TEM, FIB and other instruments.

Buehler IsoMet high Speed Pro

  • Benchtop precision cutter with automatic cutting capabilities
  • Precision sectioning saw for cutting various types of materials with minimal deformation
  • Fast hot-mounting press for samples with unusual shapes
  • Low-volume, space-saving, single specimen machine to best avoid cross-contamination of porous samples
  • Intelligent programmable grinder and polisher that can do precise Z-axis material removal with highly reproducible surface finish. A customised quick-release sample mounting system for samples with complicated shapes and sizes is made available for this equipment by the UKAEA-MRF team
  • Polisher to provide high-quality polished surfaces with exceptional flatness and minimal deformation
  • Turbo-pumped sputter & carbon coater that provides Cr, Pt, Au, Mo and Ni coating from thickness of nanometers to micrometers
  • Shear metal cutter, TEM discs puncher, Olympus BX15M Optical   Microscope and fully equipped with equipment for sample cleaning after preparations – an Ultrasonic bath, for example