Omniscan - Filmetrics F20-UVX

Sustainable Materials Innovation Hub (SMIHub) | University of Manchester

Uses non-polarised light to characterise the optical properties of thin films and film stacks.

Description

Thin film analyser used for the measurement of film thickness, refractive index, reflectance and transmission for various different film stacks, including single film stacks, multiple film stacks, free-standing films and air/film or liquid/film interfaces.

Uses / Applications

Uniformity and thickness of solution cast polymer films can be assessed. Optical properties of polymers can be tested for suitability, especially important in packaging applications where optical clarity is essential.

Specification

Spectral range from 190nm – 1700nm.

Dual Halogen and Deuterium lamps.

Thickness measurement range from 1nm – 250μm.

Accuracy of 1nm or 0.2%.

Measurements either in reflectance or transmittance.

Refractive index measurements.

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