Description
The Multidisciplinary Characterisation Facility (MCF) provides the means to study materials at a range of scales (component to sub-nm) under demanding environments as close as possible to those experienced in service.
By providing forensic analysis of the failure of materials, the MCF facilitates acceleration of a range of new materials. Services provided include Multiscale Imaging, Correlative Imaging and Multi-Dimensional Imaging (towards 4D). Based at the University of Manchester the MCF houses equipment which are also part of NXCT – National X-ray Computed Tomography and HarwellXPS
Electron Microscopy
The following facilities are available from the Electron Microscopy Centre at the University of Manchester:
pFIB
Helio 660 FIB
Quanta 3D FIB
Laser PFIB
Merlin SEM
Sigma SEM
Quanta 250 SEM
APREO SEM
Talos TEM
Titan TEM
Keyence X200K 3D laser microscope
EPMA
EBSD
TANIST
Hexamatic
Sample prep
Surface characterisation
The following facilities are part of Surface Characterisation at the University of Manchester and available from the National Graphene Institute and Photon Science Institute
NAP-XPS
HT XPS
HAXPES
ToF SIMS
Nano-SIMS
Anasys NanoIR AFM
MultiMode8 AFM
Lab RAM
Nanoindenters
X-ray Computer Tomography
The following facilities are available from the NXCT at the University of Manchester:
Colour bay
Rapiscan RTT
Nikon 225kV
MicroBay Sigray
Nikon 320kV
Nikon XTH225
Zeiss Versa 52o-DCT
Zeiss Ultra
Heliscan MKII
