Large Chamber Low Vacuum Scanning Electron Microscope JEOL 6480-LV SEM with Oxford Instruments X-MAX 80 mm2 EDX Detector Oxford Materials Characterisation Service (OMCS) | University of Oxford Home / Equipment & Facilities / Large Chamber Low Vacuum Scanning Electron Microscope Description . Specification Oxford Instruments INCA Microanalysis Software Suite Access this Equipment Make an enquiry to access this equipment using the form link below or call us on 0161 275 8382 Enquire Now
