Transmission Electron Microscope (TEM)

JEOL JEM-2100

The microscope operates a LaB6 source and is equipped with an Oxford instrument 80mm thin window EDS detector and a Gatan Orius CCD camera.

Description

The JEM-2100 is optimised for diffraction studies and diffraction-contrast imaging. In addition it performs well as a workhorse analytical TEM, supporting the high-end TEM systems in Oxford.

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