In-situ Analysis: Radiation Effects

DCF has or is developing a range of in-situ techniques designed to allow real time detailed interrogation of the effects of radiation exposure on materials. Ion beam analysis provides a range of analytical methods to identify the elemental and isotopic composition and the structural state of materials. Some ion beam analytical techniques rely on stimulating radiation to be emitted from the sample. e.g. PIXE and NRA, which are sensitive to the chemical or isotopic composition of materials. Other techniques utilise the scattering and recoil of the ions from the sample to characterise the chemical and structural makeup of materials or obtain elemental depth profiles. The high temperature loop allows for fundamental investigation into the corrosion of materials in radiation fields at nuclear reactor temperatures and pressures. Currently under development is a unique arrangement incorporating EELS and SIMS in to one of the ion accelerator beam lines, enabling real time date to be obtained during ion irradiations.

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