Description
The equipment can be used for flexible configuration to fit application requirements and is an essential manufacturing tool for fabrication of deep nanoscale devices. The system contributes to developing novel nanoelectronic devices, on-chip integrated optoelectronic circuits, quantum devices, layered material related devices, photonic and plasmonic systems. It allows both the cutting edge fabrication of small scale (lab level) and expanding these capabilities towards a large scale production. It makes a bridge between the university research activities and the wafer scale manufacturing and developing new technologies and contributes to cross disciplinary research that can impact manufacturing business in the future.
Uses / Applications
The equipment is used to measure various types of commercial antenna and flexible electronics towards ab antenna system that can operate smoothly at the at multi 5G communication band. It is also used to measure graphene-based Ultra High Frequency (UHF) Radio Frequency Identification (RFID) antennas targeted for IoT applications. We use this system to measure multiple parameters such as scattering parameters and radiation patterns to evaluate the device performance.
Specification
This suite consists of state of the art equipment for high frequency measurements.
The suite includes high frequency test equipment, in particular a MVG Star Lab Antenna Measurement System (650MHZ-18GHz); and a Keysight N222A PNA Network Analyser (10 MHz to 26.5 GHz). The antenna testing system, in combination with the network analyser, allows accurate measurement of antenna radiation patterns. The vector analyser can also be used independently to measure scattering parameters of devices and systems.
A Keysight 65 GSa/s Arbitrary Waveform Generator and a Keysight Infiniium 20 GHz Oscilloscope are also available in the suite and can be used to investigate programming kinetics of resistive switches/phase change memories.
