Equipment for high frequency measurements

  • Partner / Location:University of Cambridge
  • Contact:Professor Andrea Ferrari
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Detailed Description

This suite consists of state of the art equipment for high frequency measurements.

The suite includes high frequency test equipment, in particular a MGV Star Lab Antenna Measurement System (650MHZ-18GHz); and a Keysight N222A PNA Network Analyser (10 MHz to 26.5 GHz). The antenna testing system, in combination with the network analyser, allows accurate measurement of antenna radiation patterns. The vector analyser can also be used independently to measure scattering parameters of devices and systems.

A Keysight 65 GSa/s Arbitrary Waveform Generator and a Keysight Infiniium 20 GHz Oscilloscope are also available in the suite and can be used to investigate programming kinetics of resistive switches/phase change memories.

Uses/Applications

This suite allows for very accurate testing and characterisation of devices and materials in wafer, die or packaged forms, from -55° C to +300° C.

MGV Star Lab

Antenna Measurement System (650MHZ-18GHz)

Keysight N222A

PNA Network Analyser (10 MHz to 26.5 GHz)

Keysight 65

GSa/s Arbitrary Waveform Generator

Keysight Infiniium

20 GHz Oscilloscope


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