High Frequency Characterisation Suite
The high frequency antenna measurement system allows for allows accurate measurement of antenna radiation patterns.
Cambridge-Royce High Frequency Antenna Measurement System
- Partner:The Maxwell Centre
- Facility:Electrical Characterisation Suite
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Detailed Description
This suite includes high frequency test equipment, in particular a MGV Star Lab Antenna Measurement System (650 MHz to 18 GHz) and a Keysight N222A PNA Network Analyser (10 MHz to 26.5 GHz). The antenna testing system, in combination with the network analyser, allows accurate measurement of antenna radiation patterns. The vector analyser can also be used independently to measure scattering parameters of devices and systems.
A Keysight 65 GSa/s Arbitrary Waveform Generator and a Keysight Infiniium 20 GHz Oscilloscope are also available in the suite and can be used to investigate programming kinetics of resistive switches/phase change memories.
Uses/Applications
This suite allows for very accurate testing and characterisation of devices and materials in wafer, die or packaged forms, from -55° C to +300° C.
MGV Star Lab
Antenna Measurement System (650MHZ-18GHz)
Keysight N222A
PNA Network Analyser (10 MHz to 26.5 GHz)
Keysight 65
GSa/s Arbitrary Waveform Generator
Keysight Infiniium
20 GHz Oscilloscope
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