Description
It is also fitted with an electron energy loss spectrometer with dual EELS, fast shutter and fast simultaneous EDS/EELS acquisition. The system has pre and post filter 2k CCD cameras for acquisition of (HR)TEM images, EFTEM images and electron diffraction patterns.
The microscope can be operated with a range of in-situ holders, including gas environmental cell, liquid heating/electrochemistry and heating/electrical holders.
Specification
X-FEG Electron Source: Brightness (@200kV) = 1.8×109 A/cm2/srad. Probe Current (@200kV) = 1.5nA @ 1nm probe. Super-X EDS detector (4x windowless SDD): EDS solid angle = 0.7 srad, Energy resolution ≤ 136 eV (Mn Kα, 10 kcps). DCOR Cs Probe Corrector and A-TWIN pole piece: STEM HAADF resolution = 80 pm, TEM Information limit = 110 pm, Point resolution = 240 pm.
