Description
The instrument has a resolution capability from 0.17 mm for specimen areas with a diameter of less than 0.2 mm and up to 240 mm. Helical scanning and reconstruction capability for removal of cone beam artefacts, better signal to noise ratio and faster scanning of long specimens requiring multiple scans.
Specification
Image resolution from 0.17mm for specimen areas with diameter of <0.2mm up to 240mm.
X-ray source: 20-160kV (8W).
Sample manipulator stage with a 7kg load capacity and stage displacement of X=100mm, Y=400mm and a 360 degree continuous rotation capability.
An amorphous silicon 16 bit 3072 x 3072 pixel detector.
