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An ex-situ nanoindenter specialised for low load, high accuracy and high-speed measurements, capable of delivering quantitative nanoscale mechanical and tribological characterisation.
- Partner:University of Oxford
- Facility:David Cockayne Centre for Electron Microscopy
Or call us now on 0161 275 8382
Detailed Description
The system has the CMX module allowing for depth vs hardness/modulus/stiffness measurements. The high speed of measurement allows for grids of indents to be made across 100 µm range within hours for mapping of material properties.
Additionally, tip scanning imaging is possible because of the piezoelectric indenter control for pseudo AFM maps pre- and post-tests. This allows ex-situ testing of cantilevers with ease and sensitivity to measure slip or cracking events.
Normal Load Range: 75 nN to 10 mN
Normal Displacement Range: 0.2 nm to 5 µm
Nanowear – Normal Load Range: 100 nN to 1 mN
Wear Box Size: 4 µm – 60 µm
In-Situ SPM Imaging – Imaging Force: < 100nN
Maximum Scan Volume: 60 µm x 60 µm x 4 µm
Motorized Staging – Travel: 50 mm x 150 mm
Resolution: 50 nm