Description
We host a suite of scattering-type scanning near-field optical microscopy (s-SNOM) systems that can operate from the visible to the THz range. The capabilities are:
– Low temperature (down to 10K) and room-temperature operation
– Nanometre (~30 nm) spatial resolution
– Time-resolved detection (~80 fs temporal resolution)
– Operation in the MIR (5 – 15 um), THz (0.1 – 4THz), visible (532 nm, 685 nm) and NIR (1064 nm, 1550 nm) frequency ranges
– Flexibility to couple custom light sources to SNOM systems.
– Simultaneous imaging of amplitude, phase and topography
– Hyperspectral mapping
– Surface-sensitivity
– Tapping-mode operation to extract near-field information and perform tomography (3D mapping)
Uses / Applications
Applications of these systems include:
– 3D conductivity mapping of semiconductor materials and devices
– near-field mapping of metamaterial structures at telecom wavelengths
– chemical composition mapping (nano-FTIR spectroscopy) of surface layers
– nanoscale imaging and spectroscopy of biological cells.
Specification
