Atomic Force Microscope (AFM)

Oxford Instrument Asylum - MFP-3D

Imperial College London | Thin Film Technology Laboratory

Conductive AFM is a powerful current sensing technique for electrical characterization of conductivity variations in resistive samples.

Description

The MFP-3D AFM extend beyond basic topography measurements with a diverse set of available accessories designed to enhance the capabilities of the AFM. These include accessories for making nano-electric measurements, for example conductivity and piezoelectric response, measurements under magnetic fields, measuring nanomechanical properties, and controlling the temperature and humidity. The MFP-3D accessories make it one of the more versatile AFMs on the market suited for a wide range of applications and research.