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X-ray Microscope for Sub-Micron X-ray Imaging
- Partner:The University of Manchester
- Facility:Multidisciplinary Characterisation Facility (MCF)
Or call us now on 0161 275 8382
Detailed Description
The VersaXRM520 is a sub-micron resolution scanner with extensive imaging capabilities and an energy range between 30 keV and 160 keV. This system is fitted with X0.4, X4, X10 and X20 magnification lens for region of interest scanning, and is capable of achieving resolutions down to 70nm pixel size or spatial resolution of 0.9 microns.
Uses/Applications
Samples of all materials, typically a few mm in size.
High spatial resolution down to <0.7 μm and voxel size to 70 nm.
Energy range 40-150 keV
Power up to 10 W
Exposure correction for high aspect ratio specimens
Wide field mode for scanning wide specimens by stitching radiographs together to increase the field of view
Automated filter changer for rapid beam optimisation
Labyrinth are available for the external control and monitoring of user-installed equipment