Description
The Bruker Contour Elite 3D optical profilometer employs non-contact white light interferometry (WLI) technology, operating in both Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI) modes. This non-invasive method rapidly measures surface topography with high resolution, accommodating a wide variety of sample types and sizes. It can be used to examine a wide range of samples from 0.05% till 100% reflectivity, flat to rough and slopped surfaces, providing accurate measurements plus high-fidelity imaging. The system generates detailed 3D surface profiles for comprehensive material property analysis. With user-friendly software that simplifies setup and data interpretation, the Contour Elite is an essential tool for precise, efficient surface characterization in both research and industrial environments.
Specification
Max. sample size: The stage is 20 cm long, 10 cm wide. It can accept anything that can remain stable on the platform. Up to 10 cm thick.
Max. size of a single scan: ~ 2.9 mm x 2.4 mm, but stitching of multiple images is available.
Magnifications: 5x, 20x and 50x objectives, with integrated 0.55x, 1x and 2x lenses.
Light sources: White and green for VSI; Green for PSI.
Working environment: Air, at room temperature.
Imaging modes:
Vertical Scanning Interferometry (VSI): Best resolution in X-Y is 0.38 μm; resolution in Z is in the nanometer range; max. scanning speed in Z is 47 μm/s.
Phase Shifting Interferometry (PSI): Best resolution in X-Y is 0.38 μm; resolution in Z is in the sub-nanometer range; suitable for samples with <135 nm height difference between pixels.
