Bruker Contour Elite K

3D Optical Profiler

3D optical microscope with a through transmission media cell and objective to image the corrosion of materials in situ.

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Detailed Description

The Contour Elite K uses white light interferometry to examine the surface of samples, it has the ability to measure nanometre roughness on a large mm2 area, it can be used to examine a wide range of samples from 0.05% – 100% reflectivity, flat to rough and sloped surfaces, providing accurate measurements plus high-fidelity imaging.

  • Colour high resolution CCD
  • 0.55x zoom lens
  • 5x, 20x and 50x objectives
  • TTM module with 20x objective
  • Fast measurements 10s to 1min per image (including analysis)
  • Vision 64 and Vision64Map software provides a streamlined user interface that simplifies measurements and analysis.