Description
The thermoelectric property measurement system is a Linseis Thin Film Analyser, that allows simultaneous measurements of the electrical conductivity σ, the Seebeck coefficient α, and the thermal conductivity κ of thin films. From the measurements of these quantities the figure of merit ZT= σ α2 T/κ and the efficiency of a thermoelectric converter, in converting a flow of waste heat associated with a temperature gradient into useful electrical power, can be estimated. The measurement is based on depositing the functional material as a thin film onto a micro-fabricated silicon chip equipped with the electrodes and temperature sensors that are needed to perform the thermoelectric measurements.
Uses / Applications
Thermoelectric convertor figure of merit ZT= σ α2 T/κ can be measured in a single experiment. The system is also equipped with an electromagnet for Hall measurements on metallic samples.
Specification
The system allows measurements as a function of temperature T from about -170 °C to 200 °C.
