Description
This equipment is part of the Electron Microscopy Centre of the Multidisciplinary Characterisation Facility.
This instrument is also fitted with an electron energy loss spectrometer with dual EELS, fast shutter and fast simultaneous EDS/EELS acquisition. The system has pre and post filter 2k CCD cameras for acquisition of (HR)TEM images, EFTEM images and electron diffraction patterns.
The microscope can be operated with a range of in-situ holders, including gas environmental cell, liquid heating/electrochemistry and heating/electrical holders.
Electron beam
X-FEG Electron Source: Brightness (@200kV) = 1.8×109 A/cm2/srad. Probe Current (@200kV) = 1.5nA @ 1nm probe. Super-X EDS detector (4x windowless SDD): EDS solid angle = 0.7 srad, Energy resolution ≤ 136 eV (Mn Kα, 10 kcps). DCOR Cs Probe Corrector and A-TWIN pole piece: STEM HAADF resolution = 80 pm, TEM Information limit = 110 pm, Point resolution = 240 pm.
