Description
The PANalytical Aeris is designed for routine sample analysis, especially fast quality control. It is suitable for loose powders, small volumes and small irregular shaped solids.
Uses / Applications
The PANalytical Aeris is commonly used to characterise powder and small solids for research, producing Rietveld quality patterns in minutes.
Specification
- 6 position sample changer
- Cu X-ray source
- Ni Kβ incident beam filter
- PIXcel1D detector
- <0.04° 2θ resolution
- ± 0.02° 2θ linearity
- Excellent low angle resolution
