3D X-ray Computer Tomography Cabinet System

Zeiss Xradia 520 Versa with DCT

Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.

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Detailed Description

The Versa DCT is a sub micron resolution scanner with the same extensive imaging capabilities as the Versa, but with the utilisation of Diffraction Contrast Tomography (DCT).

DCT allows for the detection of grains within polycrystalline materials by obtaining diffraction spots during the tomography scan. As such, quantitative geometric information of the grains can be obtained in 3D.

Key Features
  • General capabilities as for the ZEISS Xradia 520 system
  • Utilisation of Diffraction Computed Tomography (DCT)
  • Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
  • Dedicated cable encapsulation of in-situ rig control


The Versa DCT instrument is housed within an enlarged cabinet to allow for the application of in-situ rigs and can be used for region of interest scanning and in-line phase contrast.


High spatial resolution down to <0.7 μm and voxel size to 70 nm

Energy range 40-150 keV

Power up to 10 W

Exposure correction for high aspect ratio specimens

Wide field mode for scanning wide specimens by stitching radiographs together to increase the field of view

Automated filter changer for rapid beam optimisation

Labyrinth are available for the external control and monitoring of user-installed equipment

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