3D X-ray Micro-computed Tomography - Zeiss VersaXRM520
Zeiss VersaXRM520 (DCT)
X-ray Microscope for Submicron X-ray Imaging, with Diffraction Contrast Tomography
- Partner:The University of Manchester
- Facility:National X-Ray Computed Tomography Lab
Or call us now on 0161 275 8382
The VersaXRM520-DCT is a sub-micron resolution scanner with extensive imaging capabilities and an energy range between 30 keV and 160 keV. This system is fitted with X0.4, X4, X10, X20, and X40 magnification lens for region of interest scanning, and is capable of achieving resolutions down to 70nm pixel size or spatial resolution of 0.7 microns. The Diffraction Contrast Tomography (LabDCT) module allows for the detection of grains within polycrystalline materials by obtaining diffraction spots during the tomography scan. As such, quantitative geometric information of the grains can be obtained in 3D.
Samples of all materials, typically a few mm in size. Metal and other polycristalline samples of <1mm for DCT imaging.
High spatial resolution down to <0.7 μm and voxel size to 70 nm
Energy range 30-160 keV
Power up to 10 W
Exposure correction for high aspect ratio specimens
Wide field mode for scanning wide specimens by stitching radiographs together to increase the field of view
Automated filter changer for rapid beam optimisation
Labyrinth are available for the external control and monitoring of user-installed equipment
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