This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
X-Ray Fluorescence
- Partner:Cranfield University
- Facility:National High Temperature Surface Engineering Centre
- Availability:Available
Or call us now on 0161 275 8382
Detailed Description
Used for non-destructive thickness measurements when the element number is Ti or larger (Z>=22) on both single and multiple layers. Capable of quantifying up to 4 elements in an alloy/diffused coating. Also used for measuring metal content in solutions, again where Z>=22. Programmable X-Y table allows large numbers of measurements to be taken automatically. Focus/adjustable Z-axis along with a camera allows local analysis of large/complex objects. Smallest spot size ≈ 1.5mm2.