Tescan Vega 3 XM SEM

LEMAS-Tescan SEM

Large chamber and high sample throughput scanning electron microscope.

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Detailed Description

Tescan VEGA3 XM. Tungsten source machine with large chamber and high sample throughput, equipped with X-max 150 SDD EDS and Aztec 3.3 software, also RGB filtered CL system.

SEM characterisation technique for the examination of the morphology, structure and chemical composition of materials drawn from geosciences, engineering and the physical sciences.

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