Tescan Vega 3 XM SEM


Large chamber and high sample throughput scanning electron microscope.

Enquire Now

Or call us now on 0161 306 7585

Detailed Description

Tescan VEGA3 XM. Tungsten source machine with large chamber and high sample throughput, equipped with X-max 150 SDD EDS and Aztec 3.3 software, also RGB filtered CL system.

SEM characterisation technique for the examination of the morphology, structure and chemical composition of materials drawn from geosciences, engineering and the physical sciences.

Enquire now

Fill in the form and a member of the Royce team will be in touch.

Thanks for your message, it has been sent.