The XTH-225 cabinet system is a standard X-ray Computed Tomography (XCT) system produced by Nikon. It is ideal for small specimens of less than 300mm in height and 180mm in width.
- Typical scan times using the Nikon Metrology 225/320 kV Custom bay vary from 10 to 120 minutes.
- The resolution will vary from 3 to 104 µm for specimen areas with a diameter of < 10 mm and up to 300 mm diameters respectively.
- Specimens larger than 300 mm can be analysed by taking linked scans that can then be pieced back together during the reconstruction stage, however this capability is limited by the cabinet size
225 kV Reflection target
Max kV: 225 kV
Max power: 225 W
Spot size: 3 μm up to 7 W, 225 μm up to 225 W
2300 x 3200
127 μm pixel size
Upto 3 fps in binning 1 and 7 fps in binning 2
Nikon XT H 225
Our three Nikon Metrology systems are best suited for larger samples, from a few mm diameter to approximately 20 cm diameter. With their high-power 225 kV and 320 kV x-ray sources, they can achieve transmission of sample up to approximately 30 mm steel. Our two walk-in bay systems are additionally well suited for in-situ work, using one of our in-situ rigs.
The Nikon Metrology XTH 225 kV cabinet system – for samples of a few cm diameter and less than 30 cm in length.
Zeiss Xradia 520 Versa
Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.
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