JEOL JXA-8230

Electron Probe MicroAnalyser

High-resolution, highly stable SEM and a WD/ED Combined Electron Probe Microanalyser (EPMA)

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Detailed Description

The JXA-8230, the fifth generation of SuperProbes, is a high resolution, highly stable SEM and a WD/ED Combined Electron Probe Microanalyzer (EPMA) with a PC-based operating environment for easy data acquisition and analysis.

The combination of up to 5 wavelength dispersive X-ray spectrometers (WDS) and a newly developed energy dispersive X-ray spectrometer (EDS) analyser featuring spectral imaging assures the most efficient and accurate analysis of data. The WD/ED combined system can simultaneously analyse up to 5 WDS elements and all EDS elements. The backscattered electron image, provided by a highly sensitive solid state detector, the secondary electron image, and optional cathodoluminescence image can all be displayed and viewed at the same time.

The JXA-8230 WD/ED combined microanalyser provides:

  • large crystal spectrometers for higher detection sensitivity for trace elements and increased count rate without sacrificing energy resolution and P/B ratio
  • PC automation for easy operation
  • EDS spectral imaging
  • Optional fan free SDD x-ray detectors for high throughput
  • high accuracy of quantitative analysis
  • high resolving power (resolution) for adjacent X-rays
  • high accuracy of quantitative analysis for light elements

The automated stage can handle samples up to 6” diameter x 2″ tall through the airlock, and can reposition a sample to less than 0.5um.


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