FEI Helios G4 CX DualBeam – High resolution monochromated FEGSEM with precise Focused Ion Beam (FIB). In-situ TEM sample preparation and Slice&View acquisition of multi signal 3D data sets.Oxford Instruments Aztec EDX system/150mm X-Max SDD detector. Quorum PP3010T Cryo-SEM system.
Focused ion beam structuring on the nanoscale. Room temperature and cryo SEM and cross sections/serial cross sections. Site specific TEM sample preparation.
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