Scios 2 HiVac with Retractable RGB CL Detector

Dual Beam FIB

Dual Beam Focused Ion Beam with Cryo stage

Enquire Now

Or call us now on 0161 275 8382

Detailed Description

This is a dual beam FIB to allow sample preparation and analysis of thin films. This includes TEM prep, slice and view tomography and cross-sectional imaging. The instrument is equipped with a cold stage so analysis of beam sensitive samples is also possible. The system is equipped with a range of detects including backscatter, secondary electron, STEM and Cathodoluminescence.

Uses/Applications

Due to the addition of a cold stage, a wide range of samples including beam sensitive samples can be analysed.