Bruker - Dimension XR AFM
Atomic Force Microscope (AFM)
The Dimension XR NanoElectrochemical (NanoEC) is part of Bruker’s extreme research (XR) series of scanning probe microscopes (SPM). This cutting-edge SPM is configured for the nanoscale electrochemical characterisation of materials in liquids and chemically reactive environments.
- Partner:The University of Sheffield
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The Dimension XR NanoEC SPM utilises Bruker’s PeakForce Tapping technology and features the AFM-based PeakForce Scanning Electrochemical Microscopy (PF-SECM).
PF-SECM performs the simultaneous nanoscale mapping of electrochemical, electrical and mechanical properties in solution. High resolution topographical images can also be simultaneously acquired.
The electrochemical cell is compatible with a wide range of solutions and liquids including many solvents. The Dimension XR NanoEC has Bruker’s DataCube-SECM analysis software which generates 3D data maps where a specific electrical parameter is plotted in XY as a function of one other operating condition.
The Dimension XR NanoEC has additional specialised imaging modes which widen its range of application. The PeakForce TUNA module allows high sensitivity, high resolution current mapping to be performed on fragile samples such as organic photovoltaics, conductive nanotubes and nanoparticles.
The module has precise force control and eliminates lateral forces preventing sample damage. The current range covered is from pA up to nA. The PeakForce Kelvin Probe Force Microscopy (PF-KPFM) module performs nanoscale surface potential mapping with both frequency modulation and amplitude modulation.
The Scanning Capacitance Microscopy module maps the change in electrostatic capacitance between the scanned probe and the surface of a sample. This imaging mode can be used to map the relative changes in carrier concentrations in semiconductors.
The accompanying Dark-Lift software enhances the mapping accuracy and eliminates photelectric artifacts. The Dimension XR NanoEC has an additional FastScan option which is capable of producing high quality images at scan rates of 20Hz compared to standard imaging rates of 1Hz.
The Dimension XR NanoEC can be used for the electrochemical and electrical characterisation of a wide range of materials and systems including:
- Energy storage systems eg Lithium-ion batteries
- Corrosion studies
- Conductive nanotubes and nanoparticles
Imaging modules: PeakForce SECM with DataCube-SECM analysis software, PeakForce TUNA with DCube-TUNA, PeakForce KPFM, PeakForce SCM with DarK-Lift software, FastScan.
Scanner: Icon Scan Head – Maximum scan area 90µm x 90µm with 10µm Z range, FastScan Scan Head – Maximum scan area 35µm x 35µm with 3µm Z range.
Sample size: 210mm diameter and 15mm thickness maximum.
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