Field Emission Gun Transmission Electron Microscope (FEG-TEM)
Advanced Metals Processing
Atoms to Devices
Chemical Materials Design
Material Systems for Demanding Environments
Materials for Energy Efficient ICT
The Talos F200X is a latest generation Field Emission Gun Transmission Electron Microscope. It is equipped with a high brightness electron source and highly efficient EDS detectors, which make it ideally suited for fast elemental mapping at the sub-nanometer scale.
It is also fitted with a large field of view 4k CMOS camera for fast acquisition of (HR)TEM images and electron diffraction patterns.
The microscope can be operated with a range of in-situ holders, including liquid heating/electrochemistry and heating/electrical holders.
X-FEG Electron Source
Brightness (@200kV) = 1.8×109 A/cm2/srad
Probe Current (@200kV) = 1.5nA @ 1nm probe
Super-X EDS detector (4x windowless SDD):
EDS solid angle = 0.9 srad
Energy resolution ≤ 136 eV (Mn Kα, 10 kcps)
X-TWIN pole piece:
STEM HAADF resolution = 0.16 nm
TEM Information limit = 0.12 nm
CETA 16M camera:
Sensor = 4096 x 4096 pixel CMOS
Frame rate 4k = 1 fps, 2k = 8 fps, 1k = 18 fps, 512 = 25 fps
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