Transmission Electron Microscope (TEM)
Atoms to Devices
The JEOL 2000FX TEM is a versatile microscope combines high-resolution imaging (0.23nm point resolution) with analytical capabilities.
The EM is used routinely for analysis of nano size particles to establish their size morphology and distributions. An energy dispersive X-ray spectrometer (EDS) is used in this TEM for X-ray microanalysis of thin specimens. EDS offers a routine microanalytical solution for determining nano-scale chemical variations in a sample. An electron energy-loss spectrometer (EELS – Gatan 666) is available for analysis of chemistry and structure, especially of light elements. An energy resolution of about 1eV is achievable.
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