2d Material

JEOL 2000FX TEM

Transmission Electron Microscope

Home / Equipment and Facilities / Transmission Electron Microscope (TEM)

Transmission Electron Microscope (TEM)
Atoms to Devices

The JEOL 2000FX TEM is a versatile microscope combines high-resolution imaging (0.23nm point resolution) with analytical capabilities.

The EM is used routinely for analysis of nano size particles to establish their size morphology and distributions. An energy dispersive X-ray spectrometer (EDS) is used in this TEM for X-ray microanalysis of thin specimens. EDS offers a routine microanalytical solution for determining nano-scale chemical variations in a sample. An electron energy-loss spectrometer (EELS – Gatan 666) is available for analysis of chemistry and structure, especially of light elements. An energy resolution of about 1eV is achievable.


Uses

Book this equipment


Fill out the form to enquire about this piece of equipment and a member of our team will be in touch with you