Hysitron Picoindenter

Picoindenter for nanomechanical testing

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The Hysitron Picoindenters are used as an accessory for a scanning electron microscope (currently a Zeiss Sigma). With these systems it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe with extreme accuracy and image the deformation process throughout the test. Vacuum compatible versions of Hysitron’s capacitive sensor technology and electrically conductive probes are used to prevent sample charging to maintain the highest resolution imaging during testing. Modes of operation include Nanioindentation, Tensile, Bending and Compression testing


Maximum Load: 30 mN

Load Noise Floor: <400 nN

Maximum Displacement: 5 μm

Displacement Noise Floor: <1 nm


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