2d Material

Dimension D3100 AFM with Nanoscope IV controller

Atomic Force Microscopy

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Atomic Force Microscopy (AFM)
Nuclear Materials

Atomic Force Microscopes (AFM) provide a very high-resolution three-dimensional image of the sample surface. This is achieved by raster scanning a sharp probe over the surface of the sample. A laser is reflected off the probe, and the deflection of this probe provides a signal to a piezoelectric scanner, which moves the sample to compensate for the deflection. This is used to measure the profile of the sample surface.

Specifications

Dimension D3100 AFM with Nanoscope IV controller

80μm x 80μm max X-Y scan size

6μm Z range

Lateral accuracy typically within 1%, maximum 2%

Provides full 16-bit resolution on all axes for all scan sizes and offsets

Large sample stage permits scanning specimens up to 8 inches diameter and 4 inches thick

Tapping / contact modes available


Uses

Surface features with a height smaller than an Ångström can be observed and a surface profile can be measured, over a maximum area of 80μm x 80μm. Other properties that can be measured include frictional, magnetic and electrical forces, and surface roughness.

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