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High-resolution Electron Backscatter Diffraction Analysis (EBSD) studies on a wide range of materials.
- Partner:University of Oxford
- Facility:David Cockayne Centre for Electron Microscopy
- Availability:Available
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Detailed Description
The Zeiss MERLIN is fitted with a Bruker e-Flash EBSD camera, angle selective backscatter detector and forward scattered electron detectors. It is optimised for high-resolution EBSD studies on a wide range of materials.
Uses/Applications
- The study of light, air sensitive materials
- Characterisation of a range of challenging materials e.g. Li energy storage materials, superconductors
– Operating voltages 20 V – 30 kV, up to 40 nA beam current
– Resolution 0.8 nm @ 15 kV, 1.6 nm @ 1 kV
– Inlens secondary electron and energy selective backscatter detectors
– Angular selective backscatter detector for crystallographic contrast
– Bruker Quantax EBSD system and eFlash camera and forward scattered electron detectors